September 25, 2021

CHICAGO PIXELS

SEMICONDUCTOR RESEARCH CENTER

Park showcases NX-TSH high-resolution, automated tip scanning head

Park Systems Inc, world-leading manufacturer of atomic force microscopes (AFMs), is showcasing its newly launched Park NX-TSH, the only automated tip scan head for large sample analysis over 300mm, at the SEMI Technology Unites Global Summit (15-19 February 2021). The Park NX-TSH is for large and heavy sample flat-panel display glass, 2D encoder sample and features conductive AFM for electric defect analysis by integrating a micro probe station…