December 4, 2021

CHICAGO PIXELS

SEMICONDUCTOR RESEARCH CENTER

k-Space launches spectral reflectance metrology tool for complex thin-film structures

k-Space Associates Inc of Dexter, MI, USA – which produces thin-film metrology instrumentation and and software for research and manufacturing of microelectronic, optoelectronic and photovoltaic devices – has announced the release of kSA SpectR, a complete non-contact metrology solution for measuring absolute spectral reflectance, L*a*b* color parameters, and growth rate…