January 17, 2022

CHICAGO PIXELS

SEMICONDUCTOR RESEARCH CENTER

New MOCVD wafer carrier defect analysis feature added to kSA Emissometer

k-Space Associates Inc of Dexter, MI, USA – which produces thin-film metrology instrumentation and software for research and manufacturing of microelectronic, optoelectronic and photovoltaic devices – has added a new feature to the kSA Emissometer that will make it more effective for detecting defects in metal-organic chemical vapor deposition (MOCVD) wafer carriers…